免费无码毛片一区二区APP,成人精品动漫一区二区,日韩久久久久久,日韩乱论免费视频

Products

current position:home page>Products>optical instrument>DataRay>

BeamMap2 Collimate

Updated:2024-05-24

Views:931

  • Brand: DataRay
  • Model: BeamMap2 Collimate
  • Description: DataRay’s BeamMap2 represents a radically different approach to real-time beam profiling. It extends the Beam'R2’s measurement capabilities by allowing for measurements at multiple locations along the
  • Feedback
  • WeChat

    QQ

    Online Service

Product Details

BeamMap2 Collimate Description:

Product Manual Datasheet Drawing

DataRay’s BeamMap2 represents a radically different approach to real-time beam profiling. It extends the Beam'R2’s measurement capabilities by allowing for measurements at multiple locations along the beam’s travel. This real-time scanning slit system uses XY slit pairs in multiple Z planes on a rotating puck to simultaneously measure four beam profiles at four different Z locations. The BeamMap2’s unique design is most advantageous for real-time measurement of focus position, M2, beam divergence, and pointing.

Compared to the standard BeamMap2, the BeamMap2 Collimate is specially designed with a significantly increased plane spacing of 5 mm for use with well-collimated beams.

Key Features

Multiple detector options covering 190 to 2500 nm

190 to 1150 nm, Silicon detector

650 to 1800 nm, InGaAs detector

1800 to 2300/2500 nm, InGaAs (extended) detector

ISO compliant beam diameter measurements

Port-powered USB 2.0

Auto-gain function

Optional stage accessory for ISO 11146- compliant M2 measurements

True2D? slits

Resolution to 0.1 μm

5 Hz update rate (adjustable 2 to 10 Hz)

Profile CW/Quasi-CW beams

Beam diameters 5 μm to 4 mm

Multiple z-plane scanning

XYZ profiles, plus θ-Φ

Focus position and diameter

Real-time M2, pointing, and divergence measurements

Identify focus with ±1 μm repeatability (beam dependent)

Example Applications

Very small laser beam profiling

Optical assembly and instrument alignment

OEM integration

Lens focal length testing

Real-time diagnosis of focusing and alignment errors

Real-time setting of multiple assemblies to the same focus

M2 measurement with available M2DU stage

True2D? Slits

0.4 μm thick metallic multilayer films on a sapphire substrate

Mutliple advantages over air slits

Avoid tunnel effect

Air slits are typically deeper than they are wide, and can buckle under high irradiance

Specification

Wavelength Si detector: 190 to 1150 nm
InGaAs detector: 650 to 1800 nm
Si + InGaAs detectors: 190 to 1800 nm
Si + InGaAs (extended) detectors: 190 to 2300 or 2500 nm
Scanned Beam Diameters Si detector: 5 μm to 4 mm
InGaAs detector: 10 μm to 3 mm
InGaAs (extended) detector: 10 μm to 2 mm
Plane Spacing 5 mm: -5, 0, +5, +20 mm
Beam Waist Diameter Measurement Second moment (4s) diameter to ISO 11146; Fitted Gaussian & TopHat
1/e2 (13.5%) width
User selectable % of peak
Beam Waist Position Measurement ± 20 μm best in X, Y, and Z — contact DataRay for recommendation
Measured Sources CW, Quasi-CW beams
Resolution Accuracy 0.1 μm or 0.05% of scan range
± < 2% ± = 0.5 μm
M2 Measurement 1 to > 20, ± 5%
Divergence/Collimation, Pointing 1 mrad best — contact DataRay for recommendation
Maximum Power & Irradiance 1 W Total & 0.5 mW/μm2
Gain Range 1?000:1 Switched; 4?096:1 ADC range
Displayed Graphics X-Y Position & Profiles? Zoom x1 to x16
Update Rate ~5 Hz, adustable 2 to 10 Hz
Pass/Fail Display On-screen selectable Pass/Fail colors. Ideal for QA & Production.
Averaging User selectable running average (1 to 8 samples)
Statistics Min.? Max.? Mean? Standard Deviation
Log data over extended periods
XY Profile & Centroid Beam Wander display and logging
Minimum Requirements Windows 10 64-bit

WeChat

Customer Service QQ

Customer Hotline:

010-52867770
0l0-52867771
l3811111452
l7896OO5796

Technical Supports

0l0-52867774
l7896OO5796
info@dorgean.com